Integrated Circuit Technology Old School Antique Vintage Electronics Book 1967
CONDITION:
1967 First Edition, McGraw-Hill In excellent condition with slight wear. Book is edited by Seymour Schwartz. No markings to text. Former owner's name on front flyleaf. DJ is in very good minus shape with some chipping / small tears along edges. NOT price clipped, ex library, or remaindered. SHIPS IN A BOX!
INTEGRATED CIRCUIT TECHNOLOGY - Instrumentation and Techniques for Measurement, Process, and Failure Analysis Edited by Seymour Schwartz Chief, Failure Mechanisms Branch of the Qualifications & Standards Laboratory, Electronic Components Research Division of the National Aeronautics and Space Administration, Electronics Research Center.
This comprehensive volume brings you complete coverage of the entire integrated circuit technology. Combining both basic theory and
practical techniques, it discusses all aspects of the field including
processing ... measurement techniques ... instrumentation . . .
equipment . . . facilities . . . and failure mechanisms analysis.
Twenty-five distinguished contributors, with such affiliations as
Westinghouse, Philco, Motorola, General Electric, RCA, North American
Aviation/Autonetics, IBM, and NASA, offer a wide range of topics.
These
include diffusion and epitaxial equipment . vacuum systems...photo masks. .. metallization, dicing, and circuit assembly equipment...electron beam
instrumentation.. . final sealing and encapsulation....
.final.infrared
testing and mask alignment .. . screened circuit fabrication equipment .
.. automatic integrated circuit test equipment .. instrumentation for
advanced microelectronic measurements .. . investigating failure
mechanisms . . . and microelectronics facilities concepts.
Consistent emphasis is placed on the instrumentation and measurement techniques required for the fabrication, test, and failure analysis of the integrated circuit. Also of outstanding practical value are the lists of equipment manufacturers, the bibliographies, and the many figures to be found throughout the book.
Among the up-to-date features included here are discussions of the latest encapsulation techniques; nondestructive testing methods using infrared, ultraviolet, and scanning electron beams; advanced cryoelectronics instrumentation and measurement methods; coherent and noncoherent radiation ; and the use of the laminar-flow work station to replace the clean-room.
This comprehensive work is designed to serve as a reference for scientists, engineers, and students active in the integrated circuit field. At the same time, it provides much valuable information for those physicists, chemists, metallurgists, and reliability engineers working in related areas. However, it does not necessarily represent the official views of NASA.